Intended Use of the Instrument: Crystallographic analysis of materials
Instrument Brand/Model: Bruker D8 Discover
AGU CRF Thematic Laboratory: Nano Imaging and Analysis Laboratory
Location of the Instrument: AGU-CRF LAB 15
Academic Director(s) of the Instrument:
Assistant Professor İlker ERDEM – ilker.erdem@agu.edu.tr
Assistant Professor Benay UZER – benay.uzer@agu.edu.tr
Responsible Specialists of the Instrument:
Res. Assist. Soner TOP – soner.top@agu.edu.tr
X-ray diffractometry is a technique to determine interspace distances and orientations between the atoms of crystalline materials. X-ray diffracts with varying angles depending on the crystal structure and diffraction pattern of the material is formed. XRD has a broad application range for investigating crystalline and amorphous materials, analysis of metals and their alloys, composition analysis of thin films, analysis of polymers.