Intended Use of the Instrument: Analysis of surface topography and chemical composition of materials
Instrument Brand/Model: Zeiss Gemini 300
AGU CRF Thematic Laboratory: Nanoimaging and Analysis Laboratory
Location of the Instrument: AGU-CRF LAB6
Academic Director(s) of the Instrument:
Assoc.Prof. Evren MUTLUGÜN - evren.mutlugun@agu.edu.tr
Asst.Prof. İsmail Alper İŞOĞLU - alper.isoglu@agu.edu.tr
Responsible Specialist(s) of the Instrument:
Res. Assist. Ahmet Faruk YAZICI - ahmet.yazici@agu.edu.tr
Res. Assist. Nazende Nur AKŞİT - nazendenur.aksit@agu.edu.tr
Zeiss Gemini 300 Field Effect SEM is equipped with secondary electron (SE) and back-scattered electron (BSE) detectors for fundamental imaging. Besides, in-lens detector offers high resolution images allowing lower working distance and accelerating voltages. STEM detector creates images in transmissive mode in a similar fashion to TEM. EDS detector is used to investigate chemical composition of specimens. A sputtering device is used to coat non-conductive specimens at nanometer scale.
The optical microscope offers brightfield, darkfield and CDIC imaging modes at 5x, 10x, 20x and 100x magnification. This microscope allows mapping a specimen and further analyze the target region in SEM thanks to the motorized stage and interchangeable sample holder with SEM.