Intended Use of the Instrument: Analysis of surface morphologies and properties of materials
Instrument Brand/Model: Nanosurf/Flex Amf C3000
AGU CRF Thematic Laboratory: Nano-Imaging and Analysis Laboratory
Location of the Instrument: AGU-CRF LAB4
Academic Director(s) of the Instrument:
Prof. Hakan USTA - hakan.usta@agu.edu.tr
Assoc. Prof. Kutay İÇÖZ- kutay.icoz@agu.edu.tr
Atomic Force Microscopy (AFM) is a three dimensional (3D) imaging technique used for morphology and topography characterization of materials. It is based on interaction between extremely sharp probe tip (cantilever) in 5-10 nm thickness and the surface of a sample. In addition to imaging the surface, it is possible to characterize the mechanical, electrical and magnetic properties of the material with static force, dynamic force, lateral force, and phase imaging methods. AFM is one of the most important tools for material characterization alongside with optical and electron microscopy, achieving resolutions down to the sub-nanometer scale. Due to its flexibility, AFM enables the analysis of many different sample types from ultra high vacuum environment to liquid samples, and therefore it could be used in various disciplines such as physics, chemistry, biology, and materials science.